Passa al contenuto
Volume

Space Grade Micro Electronics

A Masterclass in COTS Integration for Harsh Environments

The vacuum of space is no longer reserved for billion-dollar custom silicon.

Strategic Objectives

• Master the selection criteria for high-performance commercial silicon.

• Implement robust mitigation strategies against Single Event Latch-up (SEL).

• Calculate and manage Total Ionizing Dose (TID) limits for mission longevity.

• Navigate the complex trade-offs between miniaturization and reliability.

The Core Challenge

Traditional rad-hard components are too slow and expensive for the New Space era, yet standard COTS parts fail instantly under cosmic radiation.

01

The New Space Frontier

02

The Orbital Environment

03

Radiation Fundamentals

04

Total Ionizing Dose (TID)

05

Single Event Effects (SEE)

06

Single Event Latch-up (SEL)

07

The Physics of Semiconductors

08

Cosmic Rays and Solar Protons

09

The Van Allen Belts

10

COTS Selection Strategies

11

Upscreening and Testing

12

Radiation Hardening by Design (RHBD)

13

Packaging and Miniaturization

14

Memory and Data Integrity

15

Power Electronics in Space

16

FPGAs and Reconfigurable Logic

17

Thermal Management

18

Shielding Materials and Methods

19

Quality Assurance and Standards

20

Failure Mode and Effects Analysis

21

The Future of Space Computing

Available eBook Editions